BS 6740:1987, ISO 4291-1985
Comprehensive British Standard for metrology and measurement of physical phenomena. Ensure compliance and accuracy with this essential technical reference.
Comprehensive Metrology and Measurement Standard
BS 6740:1987, ISO 4291-1985 is the definitive British Standard for the metrology and measurement of physical phenomena. This essential technical reference provides detailed specifications and guidelines to ensure accurate, compliant, and reliable measurement across a wide range of applications.
Detailed Technical Specifications
Developed in collaboration with the International Organization for Standardization (ISO), this standard covers the following key areas:
- Measurement Principles: In-depth coverage of fundamental measurement concepts, including uncertainty, traceability, and calibration.
- Measurement Techniques: Comprehensive guidance on the use of various measurement instruments and methods for physical phenomena.
- Data Analysis and Reporting: Best practices for data processing, statistical analysis, and presenting measurement results.
Ensure Compliance and Accuracy
Adhering to the specifications outlined in BS 6740:1987, ISO 4291-1985 is essential for organizations and professionals working in the field of metrology and measurement. Key benefits of this standard include:
- Regulatory Compliance: Demonstrate adherence to industry regulations and standards for accurate, traceable, and reliable measurement.
- Quality Assurance: Implement robust measurement procedures to ensure consistent, high-quality results across your operations.
- Improved Decision-Making: Rely on precise, well-documented measurement data to inform critical business and engineering decisions.
A Comprehensive Technical Reference
Whether you're a metrologist, engineer, or quality professional, BS 6740:1987, ISO 4291-1985 is an indispensable resource for ensuring the accuracy and reliability of your physical measurements. With its detailed technical specifications and practical guidance, this standard will help you achieve compliance, improve quality, and make informed decisions based on reliable data.
Technical Information
Specification Details
- Method for determining departures from roundness by measuring variations in radius