ISO 12179:2000
Discover ISO 12179:2000, the essential standard for metrology and measurement, ensuring accuracy and reliability in physical phenomena evaluations.
ISO 12179:2000 - Metrology and Measurement Standards
The ISO 12179:2000 standard is a critical framework for professionals in the field of metrology and measurement, providing essential guidance on the evaluation of physical phenomena. Published on March 15, 2000, this standard is a significant part of the international protocol aimed at ensuring accuracy and reliability in measurement processes.
This standard articulates a comprehensive approach to the methodologies employed in the recording and interpretation of physical phenomena, establishing a cohesive set of criteria and recommendations that professionals must adhere to. By implementing ISO 12179:2000, organizations can enhance their measurement accuracy and ensure compliance with global standards.
ISO 12179:2000 specifically addresses the intricacies of metrology, laying out the principles that govern the measurement of physical quantities. It encompasses a range of applications, making it relevant to various industries, including aerospace, automotive, and manufacturing. By following these guidelines, organizations can minimize measurement uncertainty, leading to improved processes and outcomes.
The standard serves as an indispensable resource for metrology professionals, providing a detailed framework that underscores the importance of maintaining calibration processes, selecting appropriate measurement equipment, and adhering to recommended practices. As a result, this standard not only aids in the generation of accurate data but also fosters an environment of continuous improvement.
For researchers and practitioners alike, ISO 12179:2000 offers an authoritative reference point for ensuring that measurement operations align with recognized best practices. With its focus on precision and consistency, adherence to this standard is crucial for any organization looking to achieve excellence in measurement and calibration.
This PDF and hardcopy version of ISO 12179:2000, priced at £47.00, represents a valuable investment in quality assurance for professionals committed to upholding the highest measurement standards in their respective fields. By leveraging the insights and frameworks provided in this standard, organizations can navigate the complexities of metrology with confidence, support regulatory compliance, and ultimately drive operational efficiency.
Technical Information
Specification Details
- Specification for the methodolgy for surface metrology calibration and verification for surface profiling instruments